›› 2017, Vol. 37 ›› Issue (2): 12-23.doi: 10.16708/j.cnki.1000-758X.2017.0023

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Analyticalmodelforsecondaryelectronyieldofmetals

 HE  Jun1,2, LI  Jun1, CAO  Meng2, CUI  Wan-Zhao1,*, LIU  Chun-Liang2   

  1. 1NationalKeyLaboratoryofScienceandTechnologyonSpaceMicrowave,ChinaAcademyofSpaceTechnology(Xi′an),Xi′an710100,China
    2SchoolofElectronicsandInformationEngineering,Xi′anJiaotongUniversity,Xi′an710049,China
  • Received:2016-08-26 Revised:2017-02-17 Online:2017-04-25 Published:2017-03-21

Abstract: Anaccuratemodelforsecondaryelectronyield(SEY)isofgreatimportanceforthecalculationofmultipactorthreshold,buttheexistingSEYmodelis deficientinsatisfyingtheneedsofaccuracyandconcisenessatthesametime.AnanalyticalmodelforSEYofmetalswaspresentedbyanalyzingtheescapingprobabilityofsecondaryelectronscombinedwiththemodifiedBetheenergylossequation.Furthermore,SEYmodelsforuncleanedandArion cleanedAgsampleswereobtainedbyfittingtheexperimentalresultswiththeanalyticalmodel.CalculationresultsshowthatthestandarddeviationbetweenSEYmodelsandexperimentalresultsofuncleanedandArioncleanedAgiswithin4%atdifferentincidentangles,whichindicatesthattheanalyticalmodelpresentedcanbeusedtoestablishtheaccurateSEYmodelofmetalsandcalculatemultipactorthresholdofspacehighpowermicrowavecomponentanddensityofelectroncloudinaccelerator.

Key words: secondaryelectronyield, spacehighpowermicrowavecomponent, analyticalmodel, metalsurface, energyloss